Sun Microsystems Announces World's First Industrial Strength RFID and Sensor Test Facility

Filed in archive Companies on June 5, 2006

Sun Microsystems has combined its RFID Test Center with the Sun Advanced Product Testing environmental test laboratory in order to meet the growing demands of customers to test multi vendor RFID and sensor solutions for the ability to withstand extreme real world environmental conditions.

Sun the been reorganizing the RFID Test Center into its Colorado based Sun APT lab in order to add the ability to test RFID and sensor solutions under adverse environmental conditions such as humidity, heat, cold, altitude and pressure. The new facility is termed as the Sun Advanced Product testing Lab for RFID and Sensors. This is the world's first facility to combine industrial strength environmental stress testing with comprehensive and standards compliance testing. More information can be availed at http://www.sun.com/rfid.